mpmt-test:/dev/sdc 1715171101 smartctl 7.0 2018-12-30 r4883 [x86_64-linux-3.10.0-1160.105.1.el7.x86_64] (local build) Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 860 EVO 500GB Serial Number: S598NE0M831472A LU WWN Device Id: 5 002538 e098451e4 Firmware Version: RVT03B6Q User Capacity: 500,107,862,016 bytes [500 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Wed May 8 05:25:02 2024 PDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 092 092 000 Old_age Always - 38810 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 56 177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 8 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0 187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0032 073 057 000 Old_age Always - 27 195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 32 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 7118915951 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.