amanda:/dev/sda 1715171101 smartctl 5.43 2016-09-28 r4347 [x86_64-linux-2.6.32-754.35.1.el6.x86_64] (local build) Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Model Family: Seagate NAS HDD Device Model: ST4000VN000-1H4168 Serial Number: Z3014ES1 LU WWN Device Id: 5 000c50 065586a01 Firmware Version: SC43 User Capacity: 4,000,787,030,016 bytes [4.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: ACS-2 (unknown minor revision code: 0x001f) Local Time is: Wed May 8 05:25:01 2024 PDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 107) seconds. Offline data collection capabilities: (0x73) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 518) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x10bd) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 115 099 006 Pre-fail Always - 89116120 3 Spin_Up_Time 0x0003 092 092 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 65 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 090 060 030 Pre-fail Always - 973913975 9 Power_On_Hours 0x0032 093 011 000 Old_age Always - 6906 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 65 184 End-to-End_Error 0x0032 100 100 099 Old_age Always - 0 187 Reported_Uncorrect 0x0032 088 088 000 Old_age Always - 12 188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0 189 High_Fly_Writes 0x003a 001 001 000 Old_age Always - 21702 190 Airflow_Temperature_Cel 0x0022 077 050 045 Old_age Always - 23 (Min/Max 9/48) 191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 42 193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 65 194 Temperature_Celsius 0x0022 023 050 000 Old_age Always - 23 (0 9 0 0 0) 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 12 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 12 occurred at disk power-on lifetime: 6634 hours (276 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 08 ff ff ff 4f 00 04:28:39.986 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:39.986 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:39.986 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:39.986 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:39.986 READ FPDMA QUEUED Error 11 occurred at disk power-on lifetime: 6634 hours (276 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 08 ff ff ff 4f 00 04:28:36.145 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:36.145 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:36.145 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:36.145 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:36.145 READ FPDMA QUEUED Error 10 occurred at disk power-on lifetime: 6634 hours (276 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 08 ff ff ff 4f 00 04:28:32.267 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:32.267 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:32.267 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:32.267 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:32.267 READ FPDMA QUEUED Error 9 occurred at disk power-on lifetime: 6634 hours (276 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 08 ff ff ff 4f 00 04:28:28.426 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:28.426 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:28.426 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:28.426 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:28.426 READ FPDMA QUEUED Error 8 occurred at disk power-on lifetime: 6634 hours (276 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 08 ff ff ff 4f 00 04:28:24.563 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:24.553 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:24.553 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:24.553 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 04:28:24.553 READ FPDMA QUEUED SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.