grifstore0:/dev/sdq 1715171101 smartctl 7.0 2018-12-30 r4883 [x86_64-linux-3.10.0-1160.105.1.el7.x86_64] (local build) Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: WDC WD100EFAX-68LHPN0 Serial Number: JEKBUK0N LU WWN Device Id: 5 000cca 267efa680 Firmware Version: 83.H0A83 User Capacity: 10,000,831,348,736 bytes [10.0 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Form Factor: 3.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed May 8 05:25:05 2024 PDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 93) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: (1203) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0 2 Throughput_Performance 0x0004 131 131 054 Old_age Offline - 104 3 Spin_Up_Time 0x0007 180 180 024 Pre-fail Always - 416 (Average 315) 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 20 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000a 100 100 067 Old_age Always - 0 8 Seek_Time_Performance 0x0004 128 128 020 Old_age Offline - 18 9 Power_On_Hours 0x0012 095 095 000 Old_age Always - 38931 10 Spin_Retry_Count 0x0012 100 100 060 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 20 22 Unknown_Attribute 0x0023 100 100 025 Pre-fail Always - 100 192 Power-Off_Retract_Count 0x0032 009 009 000 Old_age Always - 109991 193 Load_Cycle_Count 0x0012 009 009 000 Old_age Always - 109991 194 Temperature_Celsius 0x0002 209 209 000 Old_age Always - 31 (Min/Max 16/42) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.