alpha00:/dev/sdd 1715171101 smartctl 7.0 2018-12-30 r4883 [x86_64-linux-3.10.0-1160.105.1.el7.x86_64] (local build) Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: WDC WD120EFAX-68UNTN0 Serial Number: 8CJ82B6E LU WWN Device Id: 5 000cca 26fdfdad7 Firmware Version: 81.00A81 User Capacity: 12,000,138,625,024 bytes [12.0 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Form Factor: 3.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed May 8 05:25:03 2024 PDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 87) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: (1227) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0 2 Throughput_Performance 0x0004 128 128 054 Old_age Offline - 108 3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 0 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 7 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000a 100 100 067 Old_age Always - 0 8 Seek_Time_Performance 0x0004 140 140 020 Old_age Offline - 15 9 Power_On_Hours 0x0012 095 095 000 Old_age Always - 40189 10 Spin_Retry_Count 0x0012 100 100 060 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 7 22 Unknown_Attribute 0x0023 100 100 025 Pre-fail Always - 100 192 Power-Off_Retract_Count 0x0032 001 001 000 Old_age Always - 163888 193 Load_Cycle_Count 0x0012 001 001 000 Old_age Always - 163888 194 Temperature_Celsius 0x0002 196 196 000 Old_age Always - 33 (Min/Max 18/54) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 2 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 35337 hours (1472 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 41 00 00 00 00 00 Error: UNC at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 20 a8 00 60 40 08 13d+23:58:38.608 READ FPDMA QUEUED 60 00 b8 a8 53 60 40 08 13d+23:58:38.608 READ FPDMA QUEUED 61 00 b0 48 17 b7 40 08 13d+23:58:38.062 WRITE FPDMA QUEUED 61 00 a8 48 13 b7 40 08 13d+23:58:38.062 WRITE FPDMA QUEUED 61 00 a0 48 0f b7 40 08 13d+23:58:38.060 WRITE FPDMA QUEUED Error 1 occurred at disk power-on lifetime: 34918 hours (1454 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 41 00 00 00 00 00 Error: UNC at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 50 c0 19 45 40 08 46d+05:35:03.141 READ FPDMA QUEUED 60 00 68 c0 25 45 40 08 46d+05:35:03.141 READ FPDMA QUEUED 60 00 60 c0 21 45 40 08 46d+05:35:03.141 READ FPDMA QUEUED 60 00 58 c0 1d 45 40 08 46d+05:35:00.406 READ FPDMA QUEUED 60 00 48 c0 15 45 40 08 46d+05:35:00.387 READ FPDMA QUEUED SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.