grifstore0:/dev/sdp
1575536461
dev="/dev/sdp">
smartctl 6.5 2016-05-07 r4318 [x86_64-linux-3.10.0-957.1.3.el7.x86_64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: WDC WD100EFAX-68LHPN0
Serial Number: 2YJXE04D
LU WWN Device Id: 5 000cca 273e91a37
Firmware Version: 83.H0A83
User Capacity: 10,000,831,348,736 bytes [10.0 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 3.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Dec 5 01:01:07 2019 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 93) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: (1090) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0004 130 130 054 Old_age Offline - 108
3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 0
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000a 100 100 067 Old_age Always - 0
8 Seek_Time_Performance 0x0004 128 128 020 Old_age Offline - 18
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 805
10 Spin_Retry_Count 0x0012 100 100 060 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1
22 Unknown_Attribute 0x0023 100 100 025 Pre-fail Always - 100
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 516
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 516
194 Temperature_Celsius 0x0002 216 216 000 Old_age Always - 30 (Min/Max 21/32)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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