grifstore1:/dev/sdf
1575545221
dev="/dev/sdf">
smartctl 6.5 2016-05-07 r4318 [x86_64-linux-3.10.0-957.1.3.el7.x86_64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Red
Device Model: WDC WD80EFZX-68UW8N0
Serial Number: VKK3E1SY
LU WWN Device Id: 5 000cca 254ebd4a3
Firmware Version: 83.H0A83
User Capacity: 8,001,563,222,016 bytes [8.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Dec 5 03:27:03 2019 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 101) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: (1292) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 132 132 054 Pre-fail Offline - 112
3 Spin_Up_Time 0x0007 143 143 024 Pre-fail Always - 466 (Average 452)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 14
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 128 128 020 Pre-fail Offline - 18
9 Power_On_Hours 0x0012 097 097 000 Old_age Always - 25336
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 13
22 Helium_Level 0x0023 100 100 025 Pre-fail Always - 100
192 Power-Off_Retract_Count 0x0032 078 078 000 Old_age Always - 27534
193 Load_Cycle_Count 0x0012 078 078 000 Old_age Always - 27534
194 Temperature_Celsius 0x0002 206 206 000 Old_age Always - 29 (Min/Max 14/38)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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